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Quantitative XPSA new method for quantitative analysis of surface nano-structures by electron spectroscopy was developed during the past years. The method builds on the fact that the XPS peak shape depends on the surface structure of the solid on the nano-meter depth scale. By analysing the peak shape of measured spectra, the quantitative composition of the surface can therefore readily be determined. The software package provides all the necesary tools needed to do the analysis. The method is non-destructive and therefore allows also to study the change in morphology of a surface nano-structure during surface treatment as e.g. chemical reaction, annealing etc. Menu Driven Graphical User InterfaceQUASES comes complete with full documentation, including a comprehensive user manual and additionally it includes examples with experimental spectra, which the user can directly work through step by step guided by detailed instructions. The software runs under DOS on 386DX or higher PC's with VGA graphics. The software is optimized for speed and the typical time to calculate one spectrum is only ~1 sec. Interactive SoftwareThe software has a menu driven graphical user interface which allows the user to interactively perform the analysis of the spectrum by changing the surface structure. A graphical representation of the assumed in-depth composition profile as well as the resulting spectrum calculated for this profile are displayed simultaneously on the screen together with the measured spectrum. Programs are available that determine the background corrected spectrum corresponding to the spectrum from a single atom as well as programs to calculate a model spectrum corresponding to a user specified in-depth concentration profile. Includes Programs for
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Copyright © 1996-1997 QUASES Tougaard ApS (17.01.97)